The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 25, 2022

Filed:

Dec. 19, 2019
Applicant:

Korea Advanced Institute of Science and Technology, Daejeon, KR;

Inventors:

JongChul Ye, Daejeon, KR;

Shujaat Khan, Daejeon, KR;

Jaeyoung Huh, Daejeon, KR;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A61B 8/08 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
A61B 8/5207 (2013.01); A61B 8/5269 (2013.01); G06T 7/0014 (2013.01); G06T 2207/10132 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01);
Abstract

An apparatus and method for processing an ultrasound image in various sensor conditions are provided. The method includes receiving a data cube via sensors, transforming the received data cube into focus data through beam focusing, and outputting inphase data and quadrature phase data for the focus data using a neural network corresponding to signal adder and Hilbert transform functions. The method further includes detecting an envelope of the inphase data and the quadrature phase data and reconstructing an ultrasound image for the data cube using log compression.


Find Patent Forward Citations

Ye, JongChul. (2022). Apparatus and method for processing ultrasound image in various sensor conditions (U.S. Patent No. 11478225). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11478225

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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