The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 18, 2022
Filed:
Jan. 25, 2021
Ramona Optics Inc., Durham, NC (US);
Mark Harfouche, Durham, NC (US);
Jaehee Park, Durham, NC (US);
Colin Cooke, Durham, NC (US);
Gregor Horstmeyer, Durham, NC (US);
Veton Saliu, Durham, NC (US);
Ramona Optics Inc., Durham, NC (US);
Abstract
A method to capture microscopy images from multiple image sensors and to relay them to one or more central processing units while minimizing delay in image capture can include the co-optimization of image acquisition hardware, data aggregation digital logic, firmware, and integration with data post processing on the central processing units. The methods can include organizing the incoming image data into data packets containing partial image frames, together with configuring the central processing units to be capable of analyzing the received partial image frames. The quick analysis of the images, e.g., on the partial image frames, can allow the computational system to rapidly respond to the captured images, such as to provide feed back on the captured images before the next images are to be captured.