The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 2022

Filed:

Nov. 23, 2020
Applicant:

Hewlett Packard Enterprise Development Lp, Houston, TX (US);

Inventors:

Yuying Chen, Beijing, CN;

Kuanyue Li, Beijing, CN;

Jianpo Han, Beijing, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 7/02 (2018.01); H04L 1/02 (2006.01); H04B 7/06 (2006.01); G01C 17/02 (2006.01); G01S 19/01 (2010.01); H04B 7/08 (2006.01);
U.S. Cl.
CPC ...
H04B 7/061 (2013.01); G01C 17/02 (2013.01); G01S 19/01 (2013.01); H04B 7/0834 (2013.01);
Abstract

Embodiments of the present disclosure relate to automatic antenna beam alignment. A method comprises determining first position-related information indicating a first location and a first orientation of a first communication device. The first communication device comprises a plurality of antenna sectors configured for generating respective directional beams. The method also comprises receiving, from a second communication device, second position-related information indicating a second location and a second orientation of the second communication device. The method also further comprises selecting a subset of the plurality of antenna sectors based on the first and the second position-related information; and causing the first communication device to perform beamforming training with the second communication device using the selected subset of antenna sectors. A decreased number of antenna sectors are scanned during the beamforming training, which can reduce the time overhead and facilitate the devices to find the best beam efficiently.


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