The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 2022

Filed:

Feb. 27, 2018
Applicant:

Kyocera Corporation, Kyoto, JP;

Inventor:

Takashi Uto, Higashiomi, JP;

Assignee:

KYOCERA Corporation, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03H 9/02 (2006.01); H03H 9/25 (2006.01); H03H 9/64 (2006.01); C30B 29/30 (2006.01); H03H 3/08 (2006.01);
U.S. Cl.
CPC ...
H03H 9/02559 (2013.01); C30B 29/30 (2013.01); H03H 3/08 (2013.01); H03H 9/02157 (2013.01); H03H 9/02842 (2013.01); H03H 9/25 (2013.01); H03H 9/6489 (2013.01);
Abstract

A substrate for a surface acoustic wave device is constituted of a piezoelectric material and includes a first surface on which a surface acoustic wave propagates, and a second surface located opposite to the first surface. The second surface has an arithmetic mean roughness (Ra) of 0.2 μm to 0.4 μm, and there is satisfied either of the relationship between the arithmetic mean roughness (Ra) and mean spacing (S) of local peaks of Ra/S≥11, and the relationship between the arithmetic mean roughness (Ra) and mean spacing (Sm) of irregularities of Ra/Sm≥6.7. Further, the second surface has a maximum height (Rmax) of 2.5 μm to 4.5 μm, and there is satisfied either of the relationship between the maximum height (Rmax) and mean spacing (S) of local peaks of Rmax/S≥130, and the relationship between the maximum height (Rmax) and mean spacing (Sm) of irregularities of Rmax/Sm≥80.


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