The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 2022

Filed:

Feb. 26, 2019
Applicant:

Openlight Photonics, Inc., Goleta, CA (US);

Inventors:

John Parker, Goleta, CA (US);

Jared Bauters, Santa Barbara, CA (US);

Jonathan Edgar Roth, San Francisco, CA (US);

Erik Norberg, Santa Barbara, CA (US);

Gregory Alan Fish, Santa Barbara, CA (US);

Assignee:

OpenLight Photonics, Inc., Goleta, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 6/293 (2006.01); H01S 5/00 (2006.01); H01S 5/0687 (2006.01); H01S 5/06 (2006.01); H01S 5/068 (2006.01); G01J 3/02 (2006.01); G01J 9/02 (2006.01); G02B 6/12 (2006.01); H01S 5/026 (2006.01); G02B 6/00 (2006.01);
U.S. Cl.
CPC ...
H01S 5/0085 (2013.01); G01J 3/02 (2013.01); G01J 9/0246 (2013.01); G02B 6/12007 (2013.01); G02B 6/29353 (2013.01); G02B 6/29395 (2013.01); G02B 6/29398 (2013.01); H01S 5/0264 (2013.01); H01S 5/0607 (2013.01); H01S 5/0612 (2013.01); H01S 5/0617 (2013.01); H01S 5/0687 (2013.01); H01S 5/06804 (2013.01); G02B 6/12004 (2013.01);
Abstract

Described are various configurations of integrated wavelength lockers including asymmetric Mach-Zehnder interferometers (AMZIs) and associated detectors. Various embodiments provide improved wavelength-locking accuracy by using an active tuning element in the AMZI to achieve an operational position with high locking sensitivity, a coherent receiver to reduce the frequency-dependence of the locking sensitivity, and/or a temperature sensor and/or strain gauge to computationally correct for the effect of temperature or strain changes.


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