The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 2022

Filed:

May. 19, 2021
Applicants:

Yoshiyuki Ando, Tokyo, JP;

Rieko Ando, Tokyo, JP;

Yukiko Noguchi, Tokyo, JP;

Emiko Takahira, Tokyo, JP;

Inventor:

Yoshiyuki Ando, Tokyo, JP;

Assignee:

Other;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01J 1/316 (2006.01); H01L 29/786 (2006.01); H01J 19/02 (2006.01); H01J 1/308 (2006.01);
U.S. Cl.
CPC ...
H01J 1/316 (2013.01); H01J 1/308 (2013.01); H01J 19/02 (2013.01); H01L 29/786 (2013.01);
Abstract

A vacuum channel field effect transistor includes a first insulator on a p-type semiconductor substrate, a gate electrode on the first insulator, a second insulator on the gate electrode, a drain electrode on the second insulator, and an n+ impurity diffusion layer in the surface of the p-type semiconductor substrate, the n+ impurity diffusion layer being in contact with a side wall including side faces of the first insulator, the gate electrode, and the second insulator. Application of predetermined voltages to the n+ impurity diffusion layer, the gate electrode, and the drain electrode causes charge carriers in the n+ impurity diffusion layer to travel through a vacuum or air faced by the side wall to the drain electrode, which can increase the source-drain current.


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