The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 2022

Filed:

Feb. 18, 2021
Applicant:

Tempus Labs, Inc., Chicago, IL (US);

Inventors:

Robert Tell, Chicago, IL (US);

Wei Zhu, Naperville, IL (US);

Justin David Finkle, Chicago, IL (US);

Christine Lo, Chicago, IL (US);

Terri M. Driessen, Chicago, IL (US);

Assignee:

Tempus Labs, Inc., Chicago, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G16B 30/10 (2019.01); G16B 20/40 (2019.01); G16B 20/20 (2019.01);
U.S. Cl.
CPC ...
G16B 30/10 (2019.02); G16B 20/20 (2019.02); G16B 20/40 (2019.02);
Abstract

Methods, systems, and software are provided for validating a somatic sequence variant in a subject having a cancer condition. Sequence reads are obtained from sequencing cell-free DNA fragments in a liquid biopsy sample of the subject. Sequence reads are aligned to a reference sequence. A variant allele fragment count and locus fragment count are identified for a candidate variant that maps to a locus in the reference sequence. The variant allele fragment count is compared against a dynamic variant count threshold for the locus. The threshold is based on a pre-test odds of a positive variant call for the locus, based on the prevalence of variants in a genomic region including the locus in a cohort of subjects having the cancer condition. The somatic sequence variant in the subject is validated, or rejected, when the variant allele fragment count for the candidate variant satisfies, or does not satisfy, the threshold.


Find Patent Forward Citations

Loading…