The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 18, 2022
Filed:
Dec. 18, 2020
Applicants:
Szu Wen Fan, Markham, CA;
Taslim Arefin Khan, Scarborough, CA;
Wei LI, Markham, CA;
Inventors:
Assignee:
HUAWEI TECHNOLOGIES CO., LTD., Shenzhen, CN;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 19/00 (2011.01); G06F 17/16 (2006.01); G06T 15/06 (2011.01); G06F 3/04842 (2022.01);
U.S. Cl.
CPC ...
G06T 19/006 (2013.01); G06F 3/04842 (2013.01); G06F 17/16 (2013.01); G06T 15/06 (2013.01);
Abstract
Methods and systems for selecting an object or location in an extended reality (XR) environment or physical environment are described. A first origin, including a first position and a first direction, and a second origin, including a second position and a second direction, are obtained by at least one sensor. An intersection of a first ray, casted from the first origin, and a second ray, casted from the second origin, is determined. A selected object or selected location is identified, based on the determined intersection. An identification of the selected object or the selected location is outputted.