The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 18, 2022
Filed:
Jul. 27, 2020
National Yang Ming Chiao Tung University, Taipei, TW;
Cheng-Chia Lee, Taipei, TW;
Huai-Che Yang, Taipei, TW;
Wen-Yuh Chung, Taipei, TW;
Chih-Chun Wu, Taipei, TW;
Wan-Yuo Guo, Taipei, TW;
Wei-Kai Lee, Taipei, TW;
Tzu-Hsuan Huang, Taipei, TW;
Chun-Yi Lin, Taipei, TW;
Chia-Feng Lu, Taipei, TW;
Yu-Te Wu, Taipei, TW;
NATIONAL YANG MING CHIAO TUNG UNIVERSITY, Taipei, TW;
Abstract
A benign tumor development trend assessment system includes an image outputting device and a server computing device. The image outputting device outputs first/second images captured from the same position in a benign tumor. The server computing device includes an image receiving module, an image pre-processing module, a target extracting module, a feature extracting module and a trend analyzing module. The image receiving module receives the first/second images. The image pre-processing module pre-processes the first/second images to obtain first/second local images. The target extracting module automatically detects and delineates tumor regions from the first/second local images to obtain first/second region of interest (ROI) images. The feature extracting module automatically identifies the first/second ROI images to obtain at least one first/second features. The trend analyzing module analyzes the first/second features to obtain a tumor development trend result.