The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 2022

Filed:

May. 14, 2019
Applicant:

Horiba, Ltd., Kyoto, JP;

Inventors:

Mineyuki Komada, Kyoto, JP;

Ryoji Ozawa, Kyoto, JP;

Assignee:

HORIBA, LTD., Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 10/06 (2012.01); G01M 15/10 (2006.01); G01M 17/007 (2006.01); G01N 1/22 (2006.01);
U.S. Cl.
CPC ...
G06Q 10/0633 (2013.01); G01M 15/102 (2013.01); G01M 17/007 (2013.01); G01N 1/22 (2013.01); G06Q 10/06395 (2013.01);
Abstract

This collectively manages an operation rate of multiple test facilities, and is an operation rate analysis system that is communicably connected to multiple test facilities that test a specimen as being a vehicle or a part of the vehicle and that analyzes an operation rate of the above-mentioned multiple test facilities, and that comprises an operation information obtaining part that obtains operation information of the above-mentioned multiple test facilities, a setting receiving part that receives a user setting relating to an operation judgment condition to judge whether each of the multiple test facilities is in operation or not, and an operation rate calculating part that calculates the operation rate of each of the multiple test facilities or the operation rate of all of the multiple test facilities from the operation information obtained by the operation information obtaining part based on the operation judgment condition received by the setting receiving part.


Find Patent Forward Citations

Komada, Mineyuki. (2022). Vehicle test facility operation rate analysis system and method (U.S. Patent No. 11475380). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11475380

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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