The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 2022

Filed:

Mar. 13, 2020
Applicant:

Cisco Technology, Inc., San Jose, CA (US);

Inventors:

Bronwyn Lewisia Woods, Pittsburgh, PA (US);

Stefano Meschiari, Portland, OR (US);

Assignee:

Cisco Technology, Inc., San Jose, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/16 (2006.01); G06N 5/04 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06N 5/04 (2013.01); G06N 20/00 (2019.01);
Abstract

In one embodiment, a machine learning model evaluation system may define standardized, extensible class hierarchies for evaluating performance of a given machine learning model. The class hierarchies may include a plurality of target classes that formalize an expected output of the given machine learning model based on a given dataset, a plurality of output classes that formalize an actual output of the given machine learning model based on the given dataset, a plurality of metric classes that formalize a comparison of the expected output of the given machine learning model with the actual output of the given machine learning model, and a plurality of datasets. When a machine learning model is received for evaluation, the system may identify a target class, an output class, and a metric class that are applicable to the machine learning model. The system may also retrieve a dataset applicable to the machine learning model.


Find Patent Forward Citations

Woods, Bronwyn. (2022). Decomposed machine learning model evaluation system (U.S. Patent No. 11475328). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11475328

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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