The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 2022

Filed:

Nov. 04, 2016
Applicant:

Microsoft Technology Licensing, Llc, Redmond, WA (US);

Inventors:

Robert Standefer, III, Duvall, WA (US);

Christopher L. Mullins, Redmond, WA (US);

John A. Taylor, Bellevue, WA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 5/02 (2006.01);
U.S. Cl.
CPC ...
G06N 5/025 (2013.01);
Abstract

The present disclosure relates to systems and methods of overlaying a plurality of isolated collections to generate an overlaid isolated collection. In an example, a first and second isolated collection having at least one common resource may be overlaid. A first and second inference ruleset may be extracted from the first and second isolated collection, respectively. Based on the first and second inference ruleset, one or more suggestions may be generated relating to conflicting inference rules. A suggestion may comprise selecting a subset of the conflicting inference rules (e.g., none, some, or all of the rules) for inclusion in the overlay isolated collection. Another suggestion may comprise generating a new inference rule based on the conflicting inference rules. An indication relating to the suggestions may be received. The indication may be used to generate a third isolated collection and a third inference ruleset.


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