The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 18, 2022
Filed:
Oct. 22, 2021
Intuit Inc., Mountain View, CA (US);
Amit Shriram Kalamkar, Fremont, CA (US);
Edward K. Lee, Mountain View, CA (US);
Vigith Maurice, Mountain View, CA (US);
Intuit Inc., Mountain View, CA (US);
Abstract
A method includes receiving first metrics describing first behaviors of applications having a fault, and second metrics describing second behaviors of an enterprise system in which the applications are executing. The first and second metrics are ingested. Ingesting includes assigning a first cardinality score to first metrics related to the fault. Ingesting also includes assigning a second, lower cardinality score to second metrics that are unrelated to the fault. Tumbling window processing is performed on the ingested metrics by sorting the first metrics and the second metrics into time slices. Each of the time slices includes a corresponding data structure for storing the data in the different time periods. Tumbling window processing is also performed on the ingested metrics by storing more data in the time slices for the first metrics having the first cardinality score relative to the second metrics having the second cardinality score.