The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 18, 2022
Filed:
Mar. 04, 2021
Hitachi, Ltd., Tokyo, JP;
Takashi Tameshige, Tokyo, JP;
Yasuyuki Tamai, Tokyo, JP;
Mineyoshi Masuda, Tokyo, JP;
Yosuke Himura, Tokyo, JP;
Kouichi Murayama, Tokyo, JP;
HITACHI, LTD., Tokyo, JP;
Abstract
Provided are an event monitoring apparatus and an event monitoring method that make it possible to set a proper threshold without handling monitoring target systems on an individual basis. There are included: a threshold determination program calculating degree of similarity between a ledger guide message and an event message, regarding a maximum value of the calculated degree of similarity as a first threshold, and setting a second threshold that is greater than the first threshold by a predetermined value; a ledger allocation program associating a ledger guide message having the degree of similarity intermediate between the first threshold and the second threshold with the event message; and a threshold evaluation program reporting the degree of similarity to a manager of a monitoring target system when the degree of similarity is higher than the first threshold.