The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 2022

Filed:

Nov. 26, 2019
Applicant:

Here Global B.v., Eindhoven, NL;

Inventors:

James Fowe, Chicago, IL (US);

Aditya Balasaheb Jadhav, Chicago, IL (US);

Assignee:

HERE GLOBAL B.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 23/02 (2006.01);
U.S. Cl.
CPC ...
G05B 23/0232 (2013.01);
Abstract

A method, apparatus and computer program product are provided to determine a measure of probe quality, such as a level of accuracy with which the location of a probe point is defined. In the context of a method and for a plurality of probe points, a distance is determined between a respective probe point and a line representative of a link. For the plurality of probe points, the method also includes determining a difference between a bearing of the respective probe point and a bearing of the link. The method further includes determining the measure of probe quality based upon a product of a representation of the distance between the plurality of probe points and the line representative of the link and a representation of the difference between the bearing of the plurality of probe points and the bearing of the link.


Find Patent Forward Citations

Fowe, James. (2022). Method, apparatus and computer program product for determining a measure of probe quality (U.S. Patent No. 11474511). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11474511

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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