The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 18, 2022
Filed:
May. 20, 2021
Palo Alto Research Center Incorporated, Palo Alto, CA (US);
Saman Mostafavi, San Francisco, CA (US);
Ajay Raghavan, Mountain View, CA (US);
Hong Yu, San Jose, CA (US);
Deokwoo Jung, Mountain View, CA (US);
Palo Alto Research Center Incorporated, Palo Alto, CA (US);
Abstract
A system and method are provided for determining a causal inference in a manufacturing process. During operation, the system can receive data associated with a processing system which includes a set of interconnected machines and an associated set of processes. The system can generate, based on the data, a graph indicating flows of outputs between the machines as part of the processes. The system can determine, based on a set of variables, one or more candidate clusters in the graph. The system can perform, based on one or more variables of interest, root cause analysis on the one or more candidate clusters by: applying an additive noise model to prune the one or more candidate clusters from the graph; and determining, based on the pruned graph, a candidate pathway likely to cause an issue in at least one process, thereby facilitating improved efficiency in the processing system.