The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 18, 2022
Filed:
Dec. 21, 2017
Applicant:
Micromass Uk Limited, Wilmslow, GB;
Inventors:
Keith George Richardson, High Peak, GB;
Steven Derek Pringle, Darwen, GB;
Assignee:
Micromass UK Limited, Wilmslow, GB;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/92 (2006.01); G01N 27/62 (2021.01); G01N 33/68 (2006.01); H01J 49/00 (2006.01); G01N 27/622 (2021.01);
U.S. Cl.
CPC ...
G01N 33/92 (2013.01); G01N 27/622 (2013.01); H01J 49/0031 (2013.01); H01J 49/0036 (2013.01); H01J 49/0045 (2013.01); G01N 33/6848 (2013.01); Y10T 436/24 (2015.01);
Abstract
A method of mass and/or ion mobility spectrometry is disclosed that includes ionising analyte from a sample so as to generate a plurality of ions, separating precursor ions from first fragment and/or other ions of the plurality of ions, fragmenting or reacting at least some of the precursor ions using a fragmentation, reaction or collision device so as to generate second fragment ions, and then analysing at least some ions that emerge from the fragmentation, reaction or collision device. The sample is classified and/or identified based on the analysis of the second fragment ions.