The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 18, 2022
Filed:
Jan. 03, 2020
The Boeing Company, Chicago, IL (US);
David Michael Gayle, Summerville, SC (US);
The Boeing Company, Chicago, IL (US);
Abstract
A method for performing metrology qualification of a non-destructive inspection (NDI) ultrasonic system includes performing, by the NDI ultrasonic system, an ultrasonic scanning operation on a calibration coupon. The ultrasonic scanning operation generates a scan signal. The method also includes superimposing a time-domain qualification mask on the scan signal and determining whether the scan signal is within the time-domain qualification mask. The method also includes validating a porosity sensitivity of the NDI ultrasonic system using a frequency-domain qualification mask. The method additionally includes qualifying the NDI ultrasonic system in response to the scan signal being within the time-domain qualification mask for a portion of the calibration coupon without a defect and the scan signal being above the time-domain qualification mask for another portion of the calibration coupon including the defect, and the porosity sensitivity of the NDI ultrasonic system being validated.