The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 2022

Filed:

Jul. 30, 2021
Applicant:

Bruker Daltonics Gmbh & Co. KG, Bremen, DE;

Inventor:

Stefan Tenzer, Mainz, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/623 (2021.01); H01J 49/00 (2006.01); H01J 49/42 (2006.01);
U.S. Cl.
CPC ...
G01N 27/623 (2021.01); H01J 49/004 (2013.01); H01J 49/0031 (2013.01); H01J 49/4215 (2013.01);
Abstract

An apparatus and a method of data independent combined ion mobility and mass spectroscopy analysis includes introducing precursor ions into an ion mobility spectrometer (IMS), sequentially releasing precursor ions from said IMS according to their ion mobility, introducing said released precursor ions into a mass filter, fragmenting the precursor ions transmitted through said mass filter to generate fragment ions, and carrying out a mass spectroscopy measurement on said fragment ions. The IMS and mass filter are controlled in a synchronized manner to carry out a plurality of IM scans, wherein adjacent mass windows in said IM scan that are associated with consecutive mass spectroscopy measurements of fragment ions overlap, such that precursor ions transmitted through said mass filter during said IM scan are located in at least one continuous scan region in an m/z-IM plane which extends in a generally diagonal direction in said m/z-IM plane.


Find Patent Forward Citations

Tenzer, Stefan. (2022). Method and apparatus for data independent combined ion mobility and mass spectroscopy analysis (U.S. Patent No. 11474072). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11474072

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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