The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 2022

Filed:

Oct. 10, 2019
Applicant:

Waters Technologies Corporation, Milford, MA (US);

Inventors:

Donald J. Russell, Orem, UT (US);

David Serrell, Draper, UT (US);

Anthony E. Arnerich, Fort Collins, CO (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 25/02 (2006.01); G01K 7/00 (2006.01); G01K 17/00 (2006.01);
U.S. Cl.
CPC ...
G01N 25/02 (2013.01); G01K 7/00 (2013.01); G01K 17/00 (2013.01);
Abstract

Described is a differential scanning calorimeter (DSC) instrument capable of performing analyses of multiple samples at the same time. Some embodiments of DSC instruments described herein include a thermal substrate that provides a substantially uniform temperature across a surface of the substrate. A plurality of DSC units is in thermal communication with the substrate, for example, by mounting the units directly to the surface of the substrate. Each DSC unit includes a second thermal substrate for further thermal isolation, and a reference platform and sample platform to receive a reference cell and a sample cell, respectively. A thermoelectric device is disposed between each platform and the second thermal substrate. Optionally, the reference and sample cells may be disposable chips that can be discarded after measurement are performed, thereby reducing or eliminating the need to clean instrument components to prevent cross-contamination for subsequent instrument operation.


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