The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 18, 2022
Filed:
Jan. 31, 2019
Shiseido Company, Ltd., Tokyo, JP;
Kouichi Nagai, Kanagawa, JP;
Kei Ujimoto, Kanagawa, JP;
Marianne Ayaka Touati, Kanagawa, JP;
Yuko Nagare, Kanagawa, JP;
Satoshi Yamaki, Kanagawa, JP;
Shiseido Company, Ltd., Tokyo, JP;
Abstract
The purpose of the present invention is to newly provide a method with which it is possible to appropriately evaluate the protective effect of an external preparation for skin such as a sunscreen cosmetic, particularly to evaluate how a UV-ray protective effect is affected by heat. This evaluation method is characterized by including (1) a step for forming a coating film of an external preparation for skin on a substrate, (2) a step for heat-treating the coating film of the external preparation for skin, and (3) a step for measuring the UV-ray protective effect of the heat-treated coating film of the external preparation for skin. The heat treatment is preferably carried out for at least one minute at a temperature of 30-70° C. The step for measuring the UV-ray protective effect preferably includes at least one selected from testing methods that involve comparing some kind of UV-ray protective effect with SPF measurement, UVAPF or PFA measurement, critical wavelength measurement, absorbance measurement, and transmittance measurement. This evaluation method can also be performed in vivo or in vitro.