The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 2022

Filed:

Apr. 25, 2018
Applicant:

Nippon Steel Corporation, Tokyo, JP;

Inventors:

Masato Sugiura, Tokyo, JP;

Hiroshi Tanei, Tokyo, JP;

Shuichi Yamazaki, Tokyo, JP;

Yasumitsu Kondo, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/35 (2014.01); G01N 33/20 (2019.01); G01N 21/71 (2006.01); G01N 21/3563 (2014.01); G01N 33/2028 (2019.01);
U.S. Cl.
CPC ...
G01N 21/3563 (2013.01); G01N 21/71 (2013.01); G01N 33/2028 (2019.01);
Abstract

A scale composition determination device () determines that FeOhas been generated in the outermost layer of a scale (SC) in the case where at least one of spectral emissivities at one wavelength and the other wavelength that are measured by radiometers for spectral emissivity measurement () is not within a predetermined range including spectral emissivities of FeO at one wavelength and the other wavelength, and determines that FeOhas not been generated in the outermost layer of the scale (SC) in the case where all of the spectral emissivities at one wavelength and the other wavelength that are measured by the radiometers for spectral emissivity measurement () is within the predetermined range including the spectral emissivities of FeO at one wavelength and the other wavelength.


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