The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 2022

Filed:

Oct. 08, 2019
Applicant:

Mayo Foundation for Medical Education and Research, Rochester, MN (US);

Inventors:

Daniel J. Schwab, Mantorville, MN (US);

Gary S. Delp, Rochester, MN (US);

Clifton R. Haider, Rochester, MN (US);

Barry K. Gilbert, Rochester, MN (US);

Nathan E. Harff, Rochester, MN (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/02 (2006.01); G01J 3/28 (2006.01); G01J 3/10 (2006.01); G01N 21/35 (2014.01);
U.S. Cl.
CPC ...
G01J 3/2803 (2013.01); G01J 3/027 (2013.01); G01J 3/0286 (2013.01); G01J 3/108 (2013.01); G01N 21/35 (2013.01); G01J 2003/2866 (2013.01);
Abstract

Spectrophotometer system configured to characterize and/or measure spectrally (wavelength)-dependent properties of material components (such as molecular, viral, and/or bacterial analytes) associated with or of an object prior to the time when optical fingerprints of such material components start to degrade, and associated methods. System can be enhanced by a capability of selecting specific wavelengths of operation for such system to optimize cost-efficiency of the system.


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