The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 18, 2022
Filed:
Oct. 14, 2019
The General Hospital Corporation, Boston, MA (US);
Nanyang Technological University, Singapore, SG;
Brett Bouma, Quincy, MA (US);
Martin Villiger, Cambridge, MA (US);
Xinyu Liu, Singapore, SG;
Linbo Liu, Cambridge, MA (US);
Qiaozhou Xiong, Singapore, SG;
Nanshuo Wang, Singapore, SG;
The General Hospital Corporation, Boston, MA (US);
Nanyang Technological University, Singapore, SG;
Abstract
A method for determining a retardance of a layer of a sample. The method includes: transmitting a first portion of a polarized light to a sample arm of an optical system and a second portion of the polarized light to a reference arm of the optical system; combining first return light returned from the sample arm and second return light from the reference arm; detecting, using a detector, the combined light along a first polarization state and a second polarization state to produce polarization data, the second polarization state being different from the first polarization state; determining, using a processor coupled to the detector, polarization states of light returning from upper and lower surfaces of a layer of the sample based on detecting the combined light; and determining, using the processor, a retardance of the layer of the sample based on the determined polarization states.