The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 18, 2022
Filed:
Oct. 21, 2019
Applicant:
Sysmex Corporation, Kobe, JP;
Inventors:
Takuya Kubo, Kobe, JP;
Shigeki Iwanaga, Kobe, JP;
Assignee:
SYSMEX CORPORATION, Kobe, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01); G01N 1/44 (2006.01); C12Q 1/6841 (2018.01); G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
C12Q 1/6841 (2013.01); G01N 21/6428 (2013.01); G01N 21/6458 (2013.01); G01N 2021/6432 (2013.01); G01N 2021/6441 (2013.01); G02B 21/0076 (2013.01);
Abstract
A sample analyzing method includes: denaturing DNA by heating a measurement specimen; bleaching the measurement specimen to inhibit autofluorescence from the measurement specimen; binding a fluorescent dye to a test substance in the measurement specimen; and capturing an image of fluorescence originated from the fluorescent dye by irradiating the measurement specimen with light. The DNA denaturation treatment is performed before the bleaching.