The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 18, 2022
Filed:
Mar. 24, 2017
Seasunbio Materials, Daejeon, KR;
Han Woo Lee, Daejeon, KR;
Si Seok Lee, Daejeon, KR;
Deokhwe Hur, Daejeon, KR;
Hee Kyung Park, Daejeon, KR;
SEASUNBIO MATERIALS, Daejeon, KR;
Abstract
Disclosed are a method for analyzing a melting curve using bi-functional fluorescent PNA probes, a method for diagnosing microsatellite instability (MSI) using the same, and a kit for diagnosing microsatellite instability (MSI) using the same. More particularly, disclosed are a method for analyzing a melting curve, based on the structure of fluorescent PNA probes that bind with different binding forces depending on the number of base mutations deleted using the fluorescent PNA probes capable of specifically binding to regions where the same base is repeated, and a method for rapidly and accurately detecting and analyzing microsatellite instability (MSI) by detecting gene mutation of microsatellite markers caused by base deletion in regions where the same base is repeated using the analysis method and analyzing the number of base mutations thus obtained. The method and kit can analyze the presence of deletion of microsatellite marker genes with high sensitivity and specificity using five microsatellite markers of Quasi loci, thus having advantages of reducing costs, shortening a test time, and the like, as compared to conventional MSI diagnostic methods.