The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 2022

Filed:

Jan. 13, 2020
Applicant:

Ovd Kinegram Ag, Zug, CH;

Inventors:

Wayne Robert Tompkin, Baden, CH;

Andreas Schilling, Hagendorn, CH;

Sebastian Mader, Baar, CH;

Assignee:

OVD Kinegram AG, Zug, CH;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B42D 25/20 (2014.01); B42D 15/00 (2006.01); B42D 25/328 (2014.01); B42D 25/40 (2014.01); G07D 7/207 (2016.01); G02B 5/18 (2006.01); G03H 1/00 (2006.01); G01B 11/24 (2006.01);
U.S. Cl.
CPC ...
B42D 25/20 (2014.10); B42D 15/00 (2013.01); B42D 25/328 (2014.10); B42D 25/40 (2014.10); G01B 11/24 (2013.01); G02B 5/1861 (2013.01); G03H 1/0011 (2013.01); G07D 7/207 (2017.05);
Abstract

A method for producing security elements, security elements, a security document with at least one security element as well as a transfer film with at least one security element, wherein a three-dimensional object is recorded and a surface profile of the three-dimensional object, described by a function F(x,y), is determined, wherein the function F(x,y) describes the distance between the surface profile and a two-dimensional reference surface spanned by co-ordinate axes x and y at the co-ordinate points x and y. A first microstructure is determined in such a way that the structure height of the first microstructure is limited to a predetermined value smaller than the maximum distance between the surface profile and the two-dimensional reference surface, and the first microstructure provides an observer with a first optical perception which corresponds to the surface profile of the three-dimensional object described by the function F(x,y).


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