The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 2022

Filed:

Apr. 12, 2019
Applicant:

Trumpf Werkzeugmaschinen Gmbh + Co. KG, Ditzingen, DE;

Inventors:

Winfried Magg, Ditzingen, DE;

David Schindhelm, Stuttgart, DE;

Boris Regaard, Stuttgart, DE;

Oliver Bocksrocker, Stuttgart, DE;

Volker Rominger, Steinheim an der Murr, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B23K 26/38 (2014.01); B23K 26/03 (2006.01); B23K 26/06 (2014.01); B23K 10/00 (2006.01);
U.S. Cl.
CPC ...
B23K 26/38 (2013.01); B23K 10/00 (2013.01); B23K 26/032 (2013.01); B23K 26/0604 (2013.01); B23K 26/0626 (2013.01); B23K 26/0643 (2013.01); B23K 26/0648 (2013.01);
Abstract

A device for monitoring, in particular for closed-loop control, of a thermal cutting process carried out on a workpiece. The device includes a focusing unit for focusing a machining beam, in particular a laser beam, onto the workpiece for the formation of a kerf on the workpiece. The device also includes an image acquisition unit to generate at least one image of a region of the workpiece, and an evaluation unit configured to determine, based on the at least one image, at least one measured variable for the course of the gap width of the kerf in a thickness direction of the workpiece. The invention also relates to an associated method for monitoring, in particular for closed-loop control, of a thermal cutting process carried out on a workpiece.


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