The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 2022

Filed:

Jan. 13, 2020
Applicant:

Cylite Pty Ltd, Notting Hills, AU;

Inventors:

Steven James Frisken, Vaucluse, AU;

Trevor Bruce Anderson, Melbourne, AU;

Armin Georg Segref, Melbourne, AU;

Grant Andrew Frisken, Mitcham, AU;

Assignee:

Cylite Pty Ltd, Notting Hill, AU;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/14 (2006.01); A61B 3/00 (2006.01); A61B 3/12 (2006.01); A61B 3/10 (2006.01); G06T 11/00 (2006.01); G02B 27/10 (2006.01); G06T 15/08 (2011.01);
U.S. Cl.
CPC ...
A61B 3/0025 (2013.01); A61B 3/102 (2013.01); A61B 3/1225 (2013.01); A61B 3/14 (2013.01); G06T 11/008 (2013.01); G02B 27/1013 (2013.01); G06T 15/08 (2013.01);
Abstract

Methods and apparatus are presented for obtaining high-resolution 3-D images of a sample over a range of wavelengths, optionally with polarisation-sensitive detection. In preferred embodiments a spectral domain OCT apparatus is used to sample the complex field of light reflected or scattered from a sample, providing full range imaging. In certain embodiments structured illumination is utilised to provide enhanced lateral resolution. In certain embodiments the resolution or depth of field of images is enhanced by digital refocusing or digital correction of aberrations in the sample. Individual sample volumes are imaged using single shot techniques, and larger volumes can be imaged by stitching together images of adjacent volumes. In preferred embodiments a 2-D lenslet array is used to sample the reflected or scattered light in the Fourier plane or the image plane, with the lenslet array suitably angled with respect to the dispersive axis of a wavelength dispersive element such that the resulting beamlets are dispersed onto unique sets of pixels of a 2-D sensor array.


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