The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 2022
Filed:
Nov. 29, 2018
Zte Corporation, Guangdong, CN;
Yijian Chen, Shenzhen, CN;
Yu Ngok Li, Shenzhen, CN;
Hao Wu, Shenzhen, CN;
Zhaohua Lu, Shenzhen, CN;
Huahua Xiao, Shenzhen, CN;
Jianxing Cai, Shenzhen, CN;
ZTE CORPORATION, Guangdong, CN;
Abstract
Provided are a method and device for triggering measurement and reporting. The method includes: configuring K1 channel state information (CSI) measurement and reporting parameter sets for a receiving end, where the CSI measurement and reporting parameter sets comprise at least one set of aperiodic measurement reference resources; configuring spatial characteristic parameters for the aperiodic measurement reference resources in the K1 CSI measurement and reporting parameter sets, where K1 is greater than or equal to 1; and indicating the K1 CSI measurement and reporting parameter sets to the receiving end; where the CSI measurement and reporting parameter sets include a measurement reference resource set, the measurement reference resource set includes at least one aperiodic measurement reference resource set; and the aperiodic measurement reference resource set includes at least one set of the aperiodic measurement reference resources.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile