The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 11, 2022

Filed:

Apr. 03, 2020
Applicant:

Analog Devices International Unlimited Company, County Limerick, IE;

Inventors:

Srivatsan Parthasarathy, Acton, MA (US);

Javier A. Salcedo, North Billerica, MA (US);

Miguel Chanca, Valencia, ES;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03F 1/52 (2006.01); H03F 1/02 (2006.01); H01L 29/205 (2006.01); H01L 29/872 (2006.01); H01L 27/06 (2006.01); H01L 29/778 (2006.01); H03F 3/195 (2006.01); H01L 27/02 (2006.01); H01L 29/20 (2006.01);
U.S. Cl.
CPC ...
H03F 1/523 (2013.01); H01L 27/0288 (2013.01); H01L 27/0629 (2013.01); H01L 29/2003 (2013.01); H01L 29/205 (2013.01); H01L 29/7786 (2013.01); H01L 29/872 (2013.01); H03F 1/0211 (2013.01); H03F 3/195 (2013.01); H03F 2200/06 (2013.01); H03F 2200/294 (2013.01); H03F 2200/426 (2013.01); H03F 2200/451 (2013.01);
Abstract

Microwave amplifiers tolerant to electrical overstress are provided. In certain embodiments, a monolithic microwave integrated circuit (MMIC) includes a signal pad that receives a radio frequency (RF) signal, a ground pad, a balun including a primary section that receives the RF signal and a secondary section that outputs a differential RF signal, an amplifier that amplifies the differential RF signal, and a plurality of decoupling elements, some of them electrically connected between the primary section and the ground pad, others electrically connected in the secondary section to a plurality of the amplifier's nodes, and operable to protect the amplifier from electrical overstress. Such electrical overstress events can include electrostatic discharge (ESD) events, such as field-induced charged-device model (FICDM) events, as well as other types of overstress conditions.


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