The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 11, 2022

Filed:

Feb. 19, 2019
Applicant:

Meta Platforms Technologies, Llc, Menlo Park, CA (US);

Inventors:

John Michael Goward, Ayr, GB;

James Ronald Bonar, Erskine, GB;

Assignee:

Meta Platforms Technologies, LLC, Menlo Park, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 33/62 (2010.01); C23C 14/14 (2006.01); C23C 14/02 (2006.01); C25D 7/12 (2006.01); C25D 3/56 (2006.01); C25D 5/48 (2006.01); C23C 14/58 (2006.01);
U.S. Cl.
CPC ...
H01L 33/62 (2013.01); C23C 14/021 (2013.01); C23C 14/14 (2013.01); C23C 14/58 (2013.01); C25D 3/56 (2013.01); C25D 5/48 (2013.01); C25D 7/123 (2013.01);
Abstract

Embodiments relate to nanoporous copper interconnects on a first body for electrically connecting to a second body. To fabricate the nanoporous copper interconnect, a zinc-copper alloy is deposited on recesses on the surface of the first body, and then the zinc is removed from the zinc-copper alloy to obtain nanoporous copper. The first body and the second body can be attached using bonding between oxide surfaces of the two bodies or be provided with underfill between the two bodies. The nanoporous copper electrically connects to an active layer or electrical components of the first body and the second bodies. Using nanoporous copper as interconnects is advantageous, among other reasons, because it can be formed at a low temperature, it is compatible with a standard complementary metal-oxide-semiconductor (CMOS) process, it provides good electrical conductivity, and it is less likely to cause issues due to migration of material.


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