The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 11, 2022

Filed:

Oct. 16, 2018
Applicant:

Robert Bosch Gmbh, Stuttgart, DE;

Inventors:

Masato Takami, Hildesheim, DE;

Uwe Brosch, Hohenhameln, DE;

Assignee:

Robert Bosch GmbH, Stuttgart, DE;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); G06V 20/58 (2022.01); G06T 7/50 (2017.01); G06N 20/00 (2019.01); B60W 60/00 (2020.01); G06K 9/62 (2022.01); G06N 3/04 (2006.01);
U.S. Cl.
CPC ...
G06V 20/58 (2022.01); B60W 60/0011 (2020.02); G06K 9/6256 (2013.01); G06N 3/04 (2013.01); G06N 20/00 (2019.01); G06T 7/50 (2017.01); G06T 2207/10028 (2013.01); G06T 2207/30261 (2013.01);
Abstract

A method for training a machine learning system, in which image data are fed into a machine learning system with processing of at least a part of the image data by the machine learning system. The method includes synthetic generation of at least a part of at least one depth map that includes a plurality of depth information values. The at least one depth map is fed into the machine learning system with processing of at least a part of the depth information values of the at least one depth map. The machine learning system is then trained based on the processed image data and based on the processed depth information values of the at least one depth map, with adaptation of a parameter value of at least one parameter of the machine learning system, the adapted parameter value influencing an interpretation of input data by the machine learning system.


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