The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 2022
Filed:
Mar. 13, 2015
California Institute of Technology, Pasadena, CA (US);
Xiaoze Ou, Pasadena, CA (US);
Changhuei Yang, Alhambra, CA (US);
California Institute of Technology, Pasadena, CA (US);
Abstract
Certain aspects pertain to Fourier camera systems and methods. In one aspect, a Fourier camera comprises a first optical system, a second optical system, a variable aperture filter, and a light detector. The first optical system configured to receive illumination reflected from a curved sample surface. The variable aperture filter configured to move an aperture to a plurality of aperture locations in a Fourier plane, wherein the aperture filters light from the first optical system to the second optical system. The light detector configured to receive light from the second optical system, and configured to acquire a plurality of raw intensity images of the curved sample surface corresponding to the plurality of aperture locations, wherein the raw images are iteratively updated in overlapping regions in Fourier space to generate a focused, substantially uniform resolution image of the curved sample surface, and wherein the overlapping regions correspond to the plurality of aperture locations.