The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 2022
Filed:
Feb. 11, 2020
Amazon Technologies, Inc., Seattle, WA (US);
Can Cui, Seattle, WA (US);
Nikolaos Chatzipanagiotis, Seattle, WA (US);
Tamal Krishna Kuila, West Bengal, IN;
Narayanan Sadagopan, Fremont, CA (US);
Amazon Technologies, Inc., Seattle, WA (US);
Abstract
Methods and apparatus for identifying features that may have a high potential impact on key application metrics. These methods rely on observational data to estimate the importance of application features, and use causal inference tools such as Double Machine Learning (double ML) or Recurrent Neural Networks (RNN) to estimate the impacts of treatment features on key metrics. These methods may allow developers to estimate the effectiveness of features without running online experiments. These methods may, for example, be used to effectively plan and prioritize online experiments. Results of the online experiments may be used to optimize key metrics of mobile applications, web applications, websites, and other web-based programs.