The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 2022
Filed:
Dec. 11, 2019
General Electric Company, Schenectady, NY (US);
Subhrajit Roychowdhury, Schenectady, NY (US);
Masoud Abbaszadeh, Clifton Park, NY (US);
Mustafa Tekin Dokucu, Latham, NY (US);
GENERAL ELECTRIC COMPANY, Schenectady, NY (US);
Abstract
An industrial asset may have monitoring nodes (e.g., sensor or actuator nodes) that generate current monitoring node values. An abnormality detection and localization computer may receive the series of current monitoring node values and output an indication of at least one abnormal monitoring node that is currently being attacked or experiencing a fault. An actor-critic platform may tune a dynamic, resilient state estimator for a sensor node and output tuning parameters for a controller that improve operation of the industrial asset during the current attack or fault. The actor-critic platform may include, for example, a dynamic, resilient state estimator, an actor model, and a critic model. According to some embodiments, a value function of the critic model is updated for each action of the actor model and each action of the actor model is evaluated by the critic model to update a policy of the actor-critic platform.