The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 2022
Filed:
Aug. 06, 2019
Oracle International Corporation, Redwood Shores, CA (US);
Mohamed Zait, San Jose, CA (US);
Yuying Zhang, Foster City, CA (US);
Hong Su, San Carlos, CA (US);
Jiakun Li, San Mateo, CA (US);
Oracle International Corporation, Redwood Shores, CA (US);
Abstract
Techniques are provided for gathering statistics in a database system. The techniques involve gathering some statistics using an 'on-the-fly' technique, some statistics through a 'high-frequency' technique, and yet other statistics using a “prediction” technique. The technique used to gather each statistic is based, at least in part, on the overhead required to gather the statistic. For example, low-overhead statistics may be gathered “on-the-fly” using the same process that is performing the operation that affects the statistic, while statistics whose gathering incurs greater overhead may be gathered in the background, while the database is live, using the high-frequency technique. The prediction technique may be used for relatively-high overhead statistics that can be predicted based on historical data and the current value of predictor statistics.