The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 2022
Filed:
May. 11, 2019
Applicant:
Foursquare Labs, Inc., New York, NY (US);
Inventors:
Bill Michels, Los Angeles, CA (US);
Tyler Bell, Los Angeles, CA (US);
Tim Chklovski, Los Angeles, CA (US);
Manuel Lagang, Los Angeles, CA (US);
Boris Shimanovsky, Los Angeles, CA (US);
Assignee:
FOURSQUARE LABS, INC., New York, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/00 (2019.01); G06F 16/21 (2019.01); G06N 20/00 (2019.01); G06F 16/23 (2019.01); G06F 16/29 (2019.01); G06F 16/35 (2019.01); G06F 16/28 (2019.01); G06F 16/31 (2019.01); G06F 16/951 (2019.01); G06F 16/2458 (2019.01); G06F 16/2455 (2019.01); G06Q 10/10 (2012.01); G06Q 50/00 (2012.01); G05B 13/02 (2006.01); H04W 4/029 (2018.01); H04W 76/38 (2018.01); H04W 4/50 (2018.01); G06Q 30/02 (2012.01); H04L 41/14 (2022.01); H04W 4/02 (2018.01); H04W 4/021 (2018.01); H04W 8/08 (2009.01); H04W 8/16 (2009.01); H04W 8/18 (2009.01); H04W 16/24 (2009.01); H04W 64/00 (2009.01); H04W 88/02 (2009.01); G06N 5/02 (2006.01); G06F 16/335 (2019.01); H04W 16/00 (2009.01); H04W 16/30 (2009.01); H04W 16/32 (2009.01); H04W 88/00 (2009.01);
U.S. Cl.
CPC ...
G06F 16/21 (2019.01); G05B 13/0265 (2013.01); G06F 16/23 (2019.01); G06F 16/235 (2019.01); G06F 16/2379 (2019.01); G06F 16/2386 (2019.01); G06F 16/2477 (2019.01); G06F 16/24564 (2019.01); G06F 16/282 (2019.01); G06F 16/285 (2019.01); G06F 16/29 (2019.01); G06F 16/313 (2019.01); G06F 16/35 (2019.01); G06F 16/951 (2019.01); G06N 5/022 (2013.01); G06N 20/00 (2019.01); G06Q 10/101 (2013.01); G06Q 30/0261 (2013.01); G06Q 30/0282 (2013.01); G06Q 50/01 (2013.01); H04L 41/14 (2013.01); H04W 4/02 (2013.01); H04W 4/021 (2013.01); H04W 4/025 (2013.01); H04W 4/029 (2018.02); H04W 4/50 (2018.02); H04W 8/08 (2013.01); H04W 8/16 (2013.01); H04W 8/18 (2013.01); H04W 16/24 (2013.01); H04W 64/00 (2013.01); H04W 64/003 (2013.01); H04W 76/38 (2018.02); H04W 88/02 (2013.01); G06F 16/337 (2019.01); H04W 16/00 (2013.01); H04W 16/30 (2013.01); H04W 16/32 (2013.01); H04W 88/00 (2013.01);
Abstract
The present disclosure relates to apparatus, systems, and methods for analyzing characteristics of entities of interest. In particular, the present disclosure provides a mechanism for analyzing information about entities of interest and for rating or scoring the entities of interest based on the analyzed information. The rating or the score of an entity of interest can sometimes be referred to as a placerank value of an entity of interest.