The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 11, 2022

Filed:

Sep. 28, 2020
Applicant:

Oath Inc., New York, NY (US);

Inventors:

Eric Theodore Bax, Sierra Madre, CA (US);

Natalie Bax, Sierra Madre, CA (US);

Assignee:

YAHOO ASSETS LLC, Dulles, VA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/30 (2019.01); G06F 11/07 (2006.01); G06F 16/28 (2019.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06F 11/076 (2013.01); G06F 11/0727 (2013.01); G06F 16/285 (2019.01); G06N 20/00 (2019.01);
Abstract

One or more computing devices, systems, and/or methods for classifier validation are provided. A set of in-sample examples are partitioned into a reduced in-sample set and a remaining in-sample set. The reduced in-sample set is processed using a set of classifiers. A subset of classifiers are identified as having error counts, over the reduced in-sample set, below a threshold number of errors. A training procedure is executed to select a classifier having a minimum error rate over the set of in-sample examples. If the classifier is within the subset of classifiers, then an out-of-sample error bound is determined for the classifier.


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