The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 11, 2022

Filed:

Jan. 25, 2017
Applicant:

Mitsubishi Electric Corporation, Tokyo, JP;

Inventors:

Masashi Tatedoko, Tokyo, JP;

Tsuyoshi Higuchi, Tokyo, JP;

Kiyoto Kawauchi, Tokyo, JP;

Takeshi Yoneda, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/00 (2013.01); G05B 19/418 (2006.01); G06F 21/55 (2013.01);
U.S. Cl.
CPC ...
G05B 19/4184 (2013.01); G05B 19/41885 (2013.01); G06F 21/554 (2013.01);
Abstract

An attack/abnormality detection device includes: a command extraction unit configured to extract elements having the same command destination as a command destination of an additionally received actual manufacturing command from among each of a set of normal manufacturing commands and a set of actual manufacturing commands, which contain information on a command destination and an arrival order, and are stored in a command storage region; and a detection unit configured to detect an attack or an abnormality by comparing details of the commands with each other for each arrival order of both extracted elements.


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