The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 11, 2022

Filed:

Apr. 02, 2020
Applicant:

Silc Technologies, Inc., Monrovia, CA (US);

Inventor:

Majid Boloorian, San Diego, CA (US);

Assignee:

SiLC Technologies, Inc., Monrovia, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 17/894 (2020.01); G01S 7/4912 (2020.01); G01S 7/481 (2006.01);
U.S. Cl.
CPC ...
G01S 17/894 (2020.01); G01S 7/4817 (2013.01); G01S 7/4912 (2013.01);
Abstract

Systems and methods described herein are directed to computationally fast and accurate processing of data acquired by a remote imaging system, such as a Light Detection and Ranging system (LIDAR). Example embodiments describe processing of scanned target data based on performing a low-resolution Fourier Transform (FT) of a beat signal that may be a function of distance and/or velocity of objects associated with the scanned target. Various methods described herein can effectively convert the low-resolution FT data into high-resolution frequency domain data that can be used to accurately estimate a frequency of the beat signal. The system may use the beat signal frequency to determine the distance and/or velocity of the corresponding object and generate point-cloud information associated with a three-dimensional image construction of the scanned target.


Find Patent Forward Citations

Loading…