The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 11, 2022

Filed:

Jan. 09, 2019
Applicant:

Alberta Centre for Advanced Mnt Products, Edmonton, CA;

Inventors:

Siamak Akhlaghi Esfahany, Edmonton, CA;

Viet Hoang, Edmonton, CA;

Ilya Utkin, Edmonton, CA;

Murray Paulson, Edmonton, CA;

Ken Brizel, Edmonton, CA;

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 7/48 (2006.01); G01S 7/481 (2006.01); G01S 17/46 (2006.01); G01B 11/25 (2006.01); G01S 17/931 (2020.01);
U.S. Cl.
CPC ...
G01S 7/4802 (2013.01); G01B 11/25 (2013.01); G01S 7/4808 (2013.01); G01S 7/4814 (2013.01); G01S 17/46 (2013.01); G01S 17/931 (2020.01);
Abstract

A lidar sensor system and method use the parallax phenomenon to determine one or more attributes of an object, such its distance, size, or shape. An optical element illuminates the object with a linear beam along a first plane. A photodetector is displaced from the optical element so that it detects the reflection of the linear beam from the object along a second plane, which is at an angle to the first plane. A computer-implemented line detection module determines a measure of deviation of the linear beam reflection from a vanishing point of the first plane. A computer-implemented analysis module determines the attribute based on the measure of deviation.


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