The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 2022
Filed:
Mar. 01, 2019
Anteverta-mw B.v., Eindhoven, NL;
Mauro Marchetti, Eindhoven, NL;
Michele Squillante, Eindhoven, NL;
Anteverta-mw B.V., Eindhoven, NL;
Abstract
A method for measuring (and controlling) a characteristic performance parameter Γof a device under test (DUT) having an input port (at the minimum). The method involves connecting the input port of the DUT to a signal generator, subjecting the DUT to a large signal input test signal, and executing a first measurement of the incident wave and reflected wave at a DUT input reference plane. The method further involves subjecting the DUT to a perturbation signal combined with the large signal input test signal, and executing a second measurement of the incident wave and reflected wave at the DUT input reference plane, and determining the characteristic performance parameter from the first measurement and the second measurement.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile