The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 2022
Filed:
Dec. 23, 2020
Industrial Technology Research Institute, Hsinchu, TW;
Yuan-Tai Chang, New Taipei, TW;
Li-Chun Huang, Hsinchu, TW;
INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE, Hsinchu, TW;
Abstract
A massive testing system of a micro integrated circuit includes: a first test area including a plurality of test pads and a plurality of reading pads, and disposed on scribe lines; a plurality of test controllers disposed on the scribe lines one by one; and a probe configured to contact the first test area to test a plurality of rows of integrated circuit chips; wherein each of the plurality of test controllers is configured to test a respective one of the plurality of rows of integrated circuit chips row by row; wherein the probe merely contacts the first test area once; wherein the plurality of reading pads are configured to read test results of each of the plurality of rows of integrated circuit chips row by row.