The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 2022
Filed:
Mar. 27, 2018
Elichens, Grenoble, FR;
Franck Lascaux, La Verpillière, FR;
ELICHENS, Grenoble, FR;
Abstract
A method for estimating a mapping of the concentration of an analyte in an environment uses sensors distributed in the environment. Each sensor generates a measurement of the analyte concentration at various measurement instants, which measurements are carried out by each sensor at each measurement instant, forming an observation vector, each term of which corresponds to a measurement arising from a sensor. The environment is spatially meshed with a plurality of mesh cells. The analyte concentration at each mesh cell, at each measurement instant, forms a 'state vector,' each term of which corresponds to an analyte concentration in a mesh cell. A 'global bias' is determined and used to correct the state vector to obtain a “debiased state vector.” The state vector is also corrected by a local correction vector as a function of a correction vector.