The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 11, 2022

Filed:

Mar. 27, 2018
Applicant:

Elichens, Grenoble, FR;

Inventor:

Franck Lascaux, La Verpillière, FR;

Assignee:

ELICHENS, Grenoble, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/00 (2006.01); G01N 27/327 (2006.01); G06F 17/11 (2006.01); G06F 17/16 (2006.01);
U.S. Cl.
CPC ...
G01N 33/0075 (2013.01); G01N 27/3274 (2013.01); G01N 33/0031 (2013.01); G06F 17/11 (2013.01); G06F 17/16 (2013.01);
Abstract

A method for estimating a mapping of the concentration of an analyte in an environment uses sensors distributed in the environment. Each sensor generates a measurement of the analyte concentration at various measurement instants, which measurements are carried out by each sensor at each measurement instant, forming an observation vector, each term of which corresponds to a measurement arising from a sensor. The environment is spatially meshed with a plurality of mesh cells. The analyte concentration at each mesh cell, at each measurement instant, forms a 'state vector,' each term of which corresponds to an analyte concentration in a mesh cell. A 'global bias' is determined and used to correct the state vector to obtain a “debiased state vector.” The state vector is also corrected by a local correction vector as a function of a correction vector.


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