The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 11, 2022

Filed:

Dec. 06, 2021
Applicant:

Vaon, Llc, Bowling Green, KY (US);

Inventors:

Henry Steen, Bowling Green, KY (US);

Vladimir Dobrokhotov, Bowling Green, KY (US);

Quentin Lineberry, Bowling Green, KY (US);

Jon Paschal, Bowling Green, KY (US);

Assignee:

VAON, LLC, Bowling Green, KY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 30/60 (2006.01); G01N 30/30 (2006.01); G01N 30/20 (2006.01); G01N 30/32 (2006.01); G01N 30/02 (2006.01);
U.S. Cl.
CPC ...
G01N 30/30 (2013.01); G01N 30/20 (2013.01); G01N 30/32 (2013.01); G01N 30/6095 (2013.01); G01N 30/60 (2013.01); G01N 2030/025 (2013.01); G01N 2030/326 (2013.01);
Abstract

A sensor structure is disclosed comprising at least four planar layers subsuming at least one cavity housed but not contained by overlapping apertures through at least two of the planar layers, wherein the at least one cavity comprises a plurality of chambers, and wherein at least one chamber of the plurality of chambers is configured to be in fluid coupling with at least one other chamber. The plurality of chambers may be defined by overlapping apertures through a plurality of the planar layers. The plurality of chambers may include a Gas Chromatograph (GC) column. The planar layers may be flexible flat glass. The planar layers may be fused together. The layers may be made with apertures through the layers disposed in a desired pattern to define complex structures by the apertures overlapping between abutting layers when the layers are stacked. The planar layers may be configured to admit ultraviolet light.


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