The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 2022
Filed:
Mar. 23, 2020
Olympus Ndt Canada Inc., Québec, CA;
Benoit Lepage, L'Ancienne-Lorette, CA;
Jean Gauthier, Quebec, CA;
Olympus NDT Canada Inc., Québec, CA;
Abstract
Systems and methods are disclosed for conducting an ultrasonic-based inspection. The systems and methods perform operations comprising: receiving, by one or more processors, data indicative of a detected tag on a specimen, the tag associated with one or more ultrasonic-based inspections that were previously performed on the specimen; retrieving, by the one or more processors, based on the detected tag, configuration data for a non-destructive testing (NDT) instrument, the configuration data being associated with the one or more ultrasonic-based inspections that were previously performed on the specimen; generating, by the one or more processors, new configuration data for the NDT instrument to perform a new inspection of the specimen at least in part using the received configuration data; and performing the new inspection of the specimen based on spatially positioning the NDT instrument relative to a position of the tag on the specimen.