The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 2022
Filed:
Jun. 28, 2019
Fujitsu Limited, Kawasaki, JP;
Eduarda Mendes Rodrigues, Northwood, GB;
Serban Georgescu, London, GB;
FUJITSU LIMITED, Kawasaki, JP;
Abstract
A defect detection method and apparatus detecting a defect in an object. The method comprises: obtaining ultrasound scan data derived from an ultrasound scan of the object under consideration, the ultrasound scan data being in the form of a set of echo amplitude values representing the amplitude of echoes received from the object during ultrasound scanning at certain spatial and temporal points; processing the ultrasound scan data to remove echo amplitude values received after a predetermined threshold time; generating at least one image from the processed ultrasound scan data; subjecting each generated image to an automated defect recognition process to determine whether there is a defect in the portion of the object represented by the image; issuing a notification indicating whether or not a defect has been found; and, if a defect has been found, storing the result of the automated defect recognition process in a defect database.