The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 2022
Filed:
Aug. 27, 2019
Applicant:
Horiba, Ltd., Kyoto, JP;
Inventor:
Tomoki Aoyama, Kyoto, JP;
Assignee:
HORIBA, LTD., Kyoto, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/2252 (2018.01); G01N 23/223 (2006.01);
U.S. Cl.
CPC ...
G01N 23/2252 (2013.01); G01N 23/223 (2013.01); G01N 2223/079 (2013.01); G01N 2223/204 (2013.01); G01N 2223/316 (2013.01);
Abstract
The X-ray analysis apparatus contains an X-ray generation unit. The X-ray generation unit includes a target plate having a target that is irradiated with an electron beam from an electron beam source and generates X-rays, X-ray convergence optics that converges X-rays generated from the target in conjunction with a movement of the target plate, and a driving unit that changes a position of the target plate or the X-ray convergence optics relative to the electron beam source.