The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 11, 2022

Filed:

Dec. 17, 2021
Applicant:

Advanced Systems & Technologies, Inc., Irvine, CA (US);

Inventor:

Vladimir Markov, Irvine, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/88 (2006.01); G01B 11/16 (2006.01); B64C 39/02 (2006.01); G01H 9/00 (2006.01);
U.S. Cl.
CPC ...
G01N 21/8806 (2013.01); B64C 39/02 (2013.01); G01B 11/16 (2013.01); G01H 9/00 (2013.01); B64C 2201/12 (2013.01);
Abstract

A system, apparatus, and method for remotely detecting defects in a structure may proceed non-destructively. A mobile sensing platform may place sensors in a desired positioning relative to the structure. The desired position may include a non-contacting relation between the sensors and structure. The mobile sensing platform may project laser beams onto the structure and sense backscattered light via the sensors. Variations in the backscattered light may correspond to motion of the structure, such as vibrations. By calculating the frequency and amplitude of the vibrations, defects in the structure may be detected. By correcting for noise, such as that associated with acceleration of the mobile sensing platform, accuracy and precision of defect detection may be enhanced.


Find Patent Forward Citations

Loading…